INDUSTRY ANALYSIS

Metrology and Defect Inspection analysis

Explore companies, technologies and supply chains. English translations are published in batches, with the original sources and dates preserved.

English edition 2026-10-17 · Updated 2026-10-17

Why AI Agents Drive CPU Demand: Workloads, Foundries, and the Named Supply Chain

As AI moves from answering questions to gathering information, operating software, running code, and repeatedly verifying results, data-center workloads are changing.

CMP PlanarizationThin-Film DepositionIon Implantation and Thermal ProcessingEDA and Semiconductor IPEtching and CleaningWafer FabricationIC DesignLithographyMetrology and Defect InspectionWafer and Packaged-Device TestingTSMC (2330)

English edition 2026-10-10 · Updated 2026-10-10

Why AI Is Driving More Testing: From HBM Probe Cards to CPO Optoelectronic Test

As AI chips move toward higher power, multiple dies, and advanced packaging, testing demand is being driven by shipment volumes, test complexity, and the cost of failure.

Metrology and Defect InspectionOptical receiver measurement & testMPI (6223)WinWay Technology (6515)Chunghwa Precision Test Tech. (6510)Enlitech (7728)Chroma ATE (2360)FormFactorTeradyneAdvantestTokyo ElectronQuantifi Photonics

English edition 2026-10-06 · Updated 2026-10-06

FOWLP vs. FOPLP: Fan-Out Packaging Advantages, Production Bottlenecks, and Costs

FOWLP and FOPLP are both forms of fan-out packaging. Their main difference is whether processing uses a circular wafer or a rectangular panel.

Semiconductor PackagingCMP PlanarizationThin-Film DepositionIon Implantation and Thermal ProcessingEtching and CleaningWafer FabricationLithographyMetrology and Defect InspectionPhotomasksProcess Chemicals and GasesSemiconductor Silicon WafersTSMC (2330)Innolux (3481)ASE Technology Holding (3711)