ENGLISH OVERVIEW
Silicon-photonics PICs with Ge PDs
Ge-on-Si photonic wafer processes
Ge absorbers are integrated with silicon waveguides so that detection becomes part of a PIC. Buyers often obtain a photonic chip or foundry process containing PDs instead of a separate Ge detector die.
Role in the receiver chain
Tower publishes high-speed Ge PDs in PH18MA; ST identifies GePDs in its PIC100 white paper; GlobalFoundries reports Ge PDs in a 300 mm platform paper. imec describes selective Ge growth and optical/electronic integration as a research platform. These disclosures do not imply identical specifications, maturity or customer production status.
Why Ge PDs are common in silicon photonics
Ge absorbs communications-band light and can be integrated beside or above silicon waveguides, alongside modulators and demultiplexers in multichannel PICs. Its appeal is platform integration and scaling channel count, not universal superiority in dark current, responsivity or bandwidth. Defect control, thermal budgets and complete-chip yield remain process challenges.
Connected industry roles
Links describe supply, classification, technology or services. They do not establish transactions between individual companies.
Photonics SOI wafers → Silicon-photonics PICs with Ge PDs
Waveguides and Ge absorbers
SOI starting wafers enter photonic processes with Ge absorber regions, rather than using bulk Ge substrates.
imec | Ge growth, PICs and electronic integrationSilicon Photonics ↔ Silicon-photonics PICs with Ge PDs
Silicon-photonic detector option
Ge-on-Si is a common detector implementation, not an automatic material classification for every silicon-photonics product.
Tower | PH18MA design kit with Ge PDsSilicon-photonics PICs with Ge PDs → Optical receiver integration
PIC containing PDs
The PIC already includes detection; receiver electronics, fiber interfaces and packaging are still required.
imec | Ge growth, PICs and electronic integrationOptical receiver measurement & test → Silicon-photonics PICs with Ge PDs
Photonic wafer testing
Characterize photonic devices at wafer level to support known-good selection.
Keysight | NX5402A silicon photonics wafer testingCompany examples & product roles
Representative roles are supported by public products, processes or services, with research and demonstrations identified. Material evidence applies to the cited product, not every product of a brand or an inferred customer contract.
GlobalFoundries ↗
Photonic process with Ge PDs
A CLEO 2026 paper reports Ge PDs in a 300 mm platform; paper results are not guaranteed specifications for every foundry product.
Official product / role sourceTower Semiconductor ↗
SiPho foundry platform with Ge PDs
The PH18MA process design kit explicitly includes high-speed Ge detectors; evidence concerns platform devices, not every customer module.
Official product / role sourceSTMicroelectronics ↗
PIC100 GePD photonic platform
The PIC100 white paper explicitly identifies GePDs; it supports material classification without implying individual customer orders.
Official product / role sourceimec ↗
Ge-on-Si process and integration research
Publishes selective Ge growth and PIC/EIC integration research; a research platform rather than a finished commercial module brand.
Official product / role source